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作 者 ：陈秋芳;焦浈;押辉远;秦广雍;

期 刊 ：核农学报 2008年 22卷 06期 页码：745-749

关键词：离子束注入；小麦；突变体；SSR；

Keywords:ion-bean implantation, wheat, mutant, simple sequence repeat,

摘 要 ：利用SSR标记技术,对从离子束注入小麦的后代中选到的株高变矮、蛋白含量提高的突变体M6进行分析,其中有两对引物扩增出与对照有差异的DNA片段。将差异DNA片段回收、克隆、测序、序列对比,结果显示,与对照相比,突变体扩增的DNA片段主要表现为碱基的置换和缺失,其中有一个DNA片段序列与对照同源性较低,经BLASTn搜索,发现该变异序列与普通小麦(Triticum aestivum)BAC克隆的一段序列匹配率达到95%。同时发现该序列与圆锥小麦(Triticum turgidum)高分子量麦谷蛋白(Agenome HMW glutenin)位点中的一段序列匹配率也达到95%。

Abstract:Wheat was implanted by ion beam and its mutant offspring plants were obtained through field selections and protein determination in the sixth generation.The mutants were with characteristic of high-protein content and dwarf.The mutants were analyzed by using SSR marker.Deletion,substitution of SSR various amplification products occured in two SSR loci in the mutants.Comparing the sequence of mutants and CK,one mutant showed low degree of sequence homology.Using BLASTn,the sequence shared 95% homology with DNA part of BAC clone in Triticum aestivum and A genome HMW glutenin in Triticum turgidum.All the results suggested that implantation of ion beam could cause DNA recombination that might be the causation of the high-protein mutant.

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