Abstract:For breeding broad-spectrum resistant cultivars to southern corn leaf blight (SCLB), a resistant corn inbred (T14) was crossed with a susceptible inbred (T18) to identify markers for Bipolaria maydis resistance genes and validate the mode of its inheritance. Genetic segregation analysis for B.maydis resistance was evaluated based upon lesion number per leaf area in the seedling stage using major gene-polygene mixed inheritance models and joint analysis of P1, P2, F1, B1, B2 and F2 populations obtained from the cross T14×T18. The result showed that resistance of sweet corn inbred T14 to B.maydis was controlled by two major genes with additive-dominance-epistatic effects, and the inheritance of the major gene was dominant. Furthermore, we carried out QTL screening with the method of multiple interval mapping (CIM). Four linked resistance QTLs to B.maydis were found on chromosome 4, counting for 7.7%, 30.9%, 14.8% and 11.5% of phenotypic variance. One resistance QTL was screened on chromosome 6, controlling 37.7% of variation. The genetic model of two major genes in T14 is consistent with QTL screening result that all resistance main QTL found in this research were distributed on only two chromosome.