SCANNING ELECTRON MICROSCOPE OBSERVATIONS ON THE DEVELOPING PROCESS OF RICE PANICLE——1.THE DIFFERENTIATING PROCESS DIFFERENCE OF SPIKELET AT VARIOUS POSITION AND 1TS RELATION TO THE CHARACTERISTICS OF GRAIN
摘 要 ：用光学显微镜和扫描电子显微镜观察水稻广二104、桂朝选两个品种(系)不同粒位小穗分化进度的差异,并研究其与籽粒性状的关系。结果发现直接着生在一级枝梗上的小穗分化顺序有多种类型,而这两个品种(系)主要属于6→5→4&1→3→2。最低位小穗(下称基小穗)比最高位小穗(下称顶小穗)分化早、粒大、结实率高、粒重较重,两者间的 t
Abstract:The process of differentiating difference of the spikelet at variouspositions were observed by dissecting binocular microscope and scanningelectron microscope,the characteristics of grain had been investigated.The results are as follows:It was found that the differentiating process of spikelet direc